Microradiographs of laser fusion targets: 2-D modeling and analysis

R. L. Whitman; R. H. Day; R. P. Kruger; D. M. Stupin

doi:10.1364/AO.18.001266

Applied Optics
Vol. 18,
Issue 8,
pp. 1266-1274
(1979)
•https://doi.org/10.1364/AO.18.001266

Microradiographs of laser fusion targets: 2-D modeling and analysis

R. L. Whitman, R. H. Day, R. P. Kruger, and D. M. Stupin

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R. L. Whitman, R. H. Day, R. P. Kruger, and D. M. Stupin, "Microradiographs of laser fusion targets: 2-D modeling and analysis," Appl. Opt. 18, 1266-1274 (1979)

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Abstract

A new contact microradiographic system for analyzing laser fusion targets with 2-D modeling and image analysis techniques is described. This system, which uses a monochromatic x-ray source and Kodak high-resolution plate emulsion, is sensitive to spherical wall thickness variations (eccentricities) as small as ±200 Å in hollow shells with a mean wall thickness of 1 μm. Measurements of wall thickness and of local and spherical wall thickness variations by radiographic techniques, using 2-D video, digital image analysis, and optical interferometry, are compared.

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Sample and exposure date	Number of defects

	2 ≤ S < 3	S ≥ 3
LB1-7-15-77	6	1
LB2-7-15-77	4	0
LB3-7-15-77	0	0
LB4-7-15-77	0	0
LB5-7-15-77	4	0
LB6-7-15-77	3	1^a
LB7-7-15-77	N/A^b	N/A^b
LB8-7-15-77	8	1
LB9-7-15-77	1	0
LB10-7-15-77	1	0
LB11-10-13-77	23	4

	Sample diameter (μm)

Sample and exposure date	2-D analysis	Interferometry
LB1-7-15-77	179	179
LB2-7-15-77	183	184
LB3-7-15-77	153	151
LB4-7-15-77	181	184
LB5-7-15-77	179	177
LB6-7-15-77	186	185
LB7-7-15-77	180	177
LB8-7-15-77	180	179
LB9-7-15-77	172	171
LB10-7-15-77	176	174
LB11-10-13-77	339	334

	Wall thickness (μm)

Sample and exposure date	2-D analysis	Interferometry	Ratio
LB1-7-15-77	1.14	1.37	1.20
LB2-7-15-77	1.11	1.44	1.30
LB3-7-15-77	0.72	0.84	1.17
LB4-7-15-77	0.98	1.56	1.59
LB5-7-15-77	1.00	1.19	1.19
LB6-7-15-77	1.00	1.23	1.23
LB7-7-15-77	N/A^a	1.05	N/A^a
LB8-7-15-77	0.98	1.21	1.23
LB9-7-15-77	1.03	1.28	1.24
LB10-7-15-77	1.11	1.55	1.40
LB11-10-13-77	1.24	0.76	0.61

	Eccentricities determined by various methods (%)

Sample and exposure date	2-D computer^a	Optical interferometry	Analog^b
LB1-7-15-77	4	3	6
LB2-7-15-77	5	8	6
LB3-7-15-77	15(21^c)	11(18^c)	21^c
LB4-7-15-77	12	10	13
LB5-7-15-77	5	3	<5
LB6-7-15-77	6	9	8
LB7-7-15-77	N/A^d	4	<5
LB8-7-15-77	≤2	5	5
LB9-7-15-77	10	11	10
LB10-7-15-77	5	5	6
LB11-10-13-77	5	<3	<5

Sample and exposure date	Number of defects

	2 ≤ S < 3	S ≥ 3
LB1-7-15-77	6	1
LB2-7-15-77	4	0
LB3-7-15-77	0	0
LB4-7-15-77	0	0
LB5-7-15-77	4	0
LB6-7-15-77	3	1^a
LB7-7-15-77	N/A^b	N/A^b
LB8-7-15-77	8	1
LB9-7-15-77	1	0
LB10-7-15-77	1	0
LB11-10-13-77	23	4

Abstract

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Applied Optics