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Piezoelectric bimorph optical beam scanners: analysis and construction

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Abstract

By adding mechanical advantage to a bender bimorph beam scanner, its angular excursion can be greatly increased with little loss in frequency response. Several alternative designs are considered. Because of their simplicity, infinite life, and improved performance, these piezoelectric bimorph beam scanners are viable alternatives to electromagnetic scanners.

© 1979 Optical Society of America

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