Abstract

This paper discusses the use of moiré techniques to enhance optically the generation of binary images in automatic visual inspection systems. Techniques for enhancing the illumination of out-of-plane features or highlighting areas of missing or misaligned parts on an assembly were investigated. The applications of these techniques to a practical inspection problem were demonstrated.

© 1979 Optical Society of America

Electronic processing of moiré fringes: application to moiré topography and comparison with photogrammetry

J. C. Perrin and A. Thomas
Appl. Opt. 18(4) 563-574 (1979)

Moiré interferometry

S. Yokozeki and S. Mihara
Appl. Opt. 18(8) 1275-1280 (1979)

Automatic moire contouring

Harvey E. Cline, William E. Lorensen, and Andrew S. Holik
Appl. Opt. 23(10) 1454-1459 (1984)

Phase-locked moiré fringe analysis for automated contouring of diffuse surfaces

Duncan T. Moore and Bruce E. Truax
Appl. Opt. 18(1) 91-96 (1979)

Moiré depth contouring

F. Heiniger and T. Tschudi
Appl. Opt. 18(10) 1577-1581 (1979)