Abstract

Freshly prepared samples of evaporated Al + 250 Å of MgF2 on glass were subjected to analysis by Auger electron spectroscopy coupled with surface erosion by Ar+ ion bombardment before and after uv irradiation. The analysis identified C and O on the mirror surfaces prior to irradiation and the addition of Si after uv irradiation in vacuum. The relative amounts of photolyzed surface contaminants were proportional to the observed decrease in mirror reflectance at 1216 Å. The Auger analysis confirmed that a very thin layer of surface contamination and not bulk photolysis in the MgF2 film was responsible for the irradiation induced reflectance loss.

© 1977 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
Monitoring the Thickness of Thin MgF2 and LiF Films on Al by Reflectance Measurements Using the 1216-Å Line of Hydrogen

E. T. Hutcheson, J. T. Cox, G. Hass, and W. R. Hunter
Appl. Opt. 11(7) 1590-1593 (1972)

Further Studies on MgF2-Overcoated Aluminum Mirrors with Highest Reflectance in the Vacuum Ultraviolet

L. R. Canfield, G. Hass, and J. E. Waylonis
Appl. Opt. 5(1) 45-50 (1966)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (6)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription