X-ray calibration of RAR 2490 film for application to laser plasma experiments

Robert F. Benjamin; Peter B. Lyons; Robert H. Day

doi:10.1364/AO.16.000393

Applied Optics
Vol. 16,
Issue 2,
pp. 393-397
(1977)
•https://doi.org/10.1364/AO.16.000393

X-ray calibration of RAR 2490 film for application to laser plasma experiments

Robert F. Benjamin, Peter B. Lyons, and Robert H. Day

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
Robert F. Benjamin, Peter B. Lyons, and Robert H. Day, "X-ray calibration of RAR 2490 film for application to laser plasma experiments," Appl. Opt. 16, 393-397 (1977)

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

An x-ray sensitometric calibration of Kodak RAR 2490 film has been performed over the 0.28–8.04-keV range of photon energies. The characteristic curves (optical density D vs exposure H) are fit well over the entire range by a two-parameter, analytic function, log₁₀(10^D − 1) = A log₁₀H + B. Solarization is found to occur at an exposure of 2 × 10³ photons/(μm)² for 1.49-keV photons. Comparison with other films is made.

Full Article | PDF Article

More Like This

X-ray calibration of Kodak Direct Exposure film

P. D. Rockett, C. R. Bird, C. J. Hailey, D. Sullivan, D. B. Brown, and P. G. Burkhalter
Appl. Opt. 24(16) 2536-2542 (1985)

Low-energy x-ray response of photographic films. II. Experimental characterization

B. L. Henke, F. G. Fujiwara, M. A. Tester, C. H. Dittmore, and M. A. Palmer
J. Opt. Soc. Am. B 1(6) 828-849 (1984)

X-ray shadowgraphing in laser-produced plasma experiments

David B. vanHulsteyn and Robert F. Benjamin
Opt. Lett. 1(2) 76-78 (1977)

Previous Article Next Article

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (6)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Tables (2)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (6)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

			Filter		Henke tube

X-ray photon energy (keV)	Fluor material	Anode material	Material	Thickness $(\frac{mg}{{cm}^{2}})$	V (kV)	I (mA)	Flux on film $(\frac{10^{- 3} photons}{{(μ m)}^{2} s})$	Purity (%)
0.279	—	C	Kimfoil	0.277	0.60	10	29.6
0.525	—	Li₂ O	Cr	0.37	1.00	10	59.0
0.852	—	Ni	Ni	1.15	1.60	50	20.3
1.04	NaCO₃	Al	Mg	2.7	2.80	350	0.92	96
1.25	Mg	Al	Mg	2.7	2.40	350	4.9	99.9
1.49	Al	Cu	Al	1.7	3.00	50	1.01	87
						500	8.9
1.74	Si	Cu	SiO	3.0	3.00	60	0.212	97
						600	1.77
2.31	S	Cu	Nb	1.0	6.00	50	3.47	93
						500	31.2
2.62	Cl	Cu	Saran	5.97	8.00	30	7.73	91
3.31	K	Cu	Ag	1.58	8.00	30	5.31	89
						300	47.8
3.69	Ca	Cu	In	2.0	8.00	15	0.823	95
							7.69
4.95	V	Cu	Ti	11.5	11.00	27	15.2	97
							139.0
7.47	Ni	Cu	Co	14.9	12.00	2.5	1.24	92
						25.0	12.5
8.04	Cu	Cu	Ni	13.6	14.00	21	17.4	94
						210	164.0

X-ray photon energy (keV)	A	B	Flux at o.d. = 0.5 ${(\frac{photons}{{(μ m)}^{2}})}^{- 1}$	Max. meas. o.d.	Max. meas. flux $(\frac{photons}{{(μ m)}^{2}})$
0.279	0.908	−0.242	0.247	1.65	148.
0.525	0.799	−0.450	0.108	1.47	273.0
0.852	0.939	−0.271	0.243	1.81	203.0
1.04	1.147	−0.144	0.406	0.71	4.6
1.25	1.171	−0.0646	0.477	1.14	9.8
1.49	1.137	−0.0391	0.551	1.76	35.6
1.74	1.286	−0.0244	0.638	1.60	17.0
2.31	1.265	−0.0200	0.529	1.60	25.0
2.62	1.215	−0.0743	0.492	1.77	51.0
3.31	1.140	−0.266	0.303	1.57	52.3
3.69	1.116	−0.0497	0.464	1.60	41.1
4.95	1.078	−0.236	0.298	1.68	66.7
7.47	1.174	−0.710	0.120	1.44	89.3
8.04	1.168	−0.940	0.102	1.33	65.6

			Filter		Henke tube

X-ray photon energy (keV)	Fluor material	Anode material	Material	Thickness $(\frac{mg}{{cm}^{2}})$	V (kV)	I (mA)	Flux on film $(\frac{10^{- 3} photons}{{(μ m)}^{2} s})$	Purity (%)
0.279	—	C	Kimfoil	0.277	0.60	10	29.6
0.525	—	Li₂ O	Cr	0.37	1.00	10	59.0
0.852	—	Ni	Ni	1.15	1.60	50	20.3
1.04	NaCO₃	Al	Mg	2.7	2.80	350	0.92	96
1.25	Mg	Al	Mg	2.7	2.40	350	4.9	99.9
1.49	Al	Cu	Al	1.7	3.00	50	1.01	87
						500	8.9
1.74	Si	Cu	SiO	3.0	3.00	60	0.212	97
						600	1.77
2.31	S	Cu	Nb	1.0	6.00	50	3.47	93
						500	31.2
2.62	Cl	Cu	Saran	5.97	8.00	30	7.73	91
3.31	K	Cu	Ag	1.58	8.00	30	5.31	89
						300	47.8
3.69	Ca	Cu	In	2.0	8.00	15	0.823	95
							7.69
4.95	V	Cu	Ti	11.5	11.00	27	15.2	97
							139.0
7.47	Ni	Cu	Co	14.9	12.00	2.5	1.24	92
						25.0	12.5
8.04	Cu	Cu	Ni	13.6	14.00	21	17.4	94
						210	164.0

X-ray photon energy (keV)	A	B	Flux at o.d. = 0.5 ${(\frac{photons}{{(μ m)}^{2}})}^{- 1}$	Max. meas. o.d.	Max. meas. flux $(\frac{photons}{{(μ m)}^{2}})$
0.279	0.908	−0.242	0.247	1.65	148.
0.525	0.799	−0.450	0.108	1.47	273.0
0.852	0.939	−0.271	0.243	1.81	203.0
1.04	1.147	−0.144	0.406	0.71	4.6
1.25	1.171	−0.0646	0.477	1.14	9.8
1.49	1.137	−0.0391	0.551	1.76	35.6
1.74	1.286	−0.0244	0.638	1.60	17.0
2.31	1.265	−0.0200	0.529	1.60	25.0
2.62	1.215	−0.0743	0.492	1.77	51.0
3.31	1.140	−0.266	0.303	1.57	52.3
3.69	1.116	−0.0497	0.464	1.60	41.1
4.95	1.078	−0.236	0.298	1.68	66.7
7.47	1.174	−0.710	0.120	1.44	89.3
8.04	1.168	−0.940	0.102	1.33	65.6

Abstract

Cited By

Figures (6)

Tables (2)

Equations (6)

Applied Optics