Abstract

We have developed a unique approach for evaluating the local composition x as a function of position on the surface of crystals of Hg1−xCdxTe utilizing electrolyte electroreflectance. The method is nondestructive and can be employed at room temperature. The technique is sensitive enough to determine changes of composition Δx ≈ 0.002 for samples in which x ≈ 0.2–0.3 with a spatial resolution of about 150 μm. This approach has a number of advantages over the microprobe technique.

© 1977 Optical Society of America

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