Abstract

A new interferometer has been developed which can be used both for analyzing the homogeneity of ir materials and for inspecting the waveform emerging from an optical system. This new type of interferometer utilizes a diffraction grating as a beam divider and further permits an important variation in the fringe contrast to be obtained for a given blaze angle by the variation of the efficacity of the grating with the orientation of the plane of polarization. This improvement permits the compensation of photometric losses due to either an absorbing material or a highly reflecting material that may be under test. By this way it is possible to evaluate all materials within a 10–100% transmission range. This interferometer functions at 10.6 μm. Results obtained are detailed herein.

© 1975 Optical Society of America

Infrared interferometer with a scanned aperture

R. P. Edwin
Appl. Opt. 14(8) 1997-2001 (1975)

Standard of flatness: its application to Fabry-Perot interferometers

J. P. Marioge, B. Bonino, and M. Mullot
Appl. Opt. 14(9) 2283-2285 (1975)

Spherical Aberration Measurement with Shearing Interferometer Using Fourier Imaging and Moiré Method

Shunsuke Yokozeki and Kazuo Ohnishi
Appl. Opt. 14(3) 623-627 (1975)

Absorption of thin film materials at 10.6 μm

W. E. K. Gibbs and A. W. Butterfield
Appl. Opt. 14(12) 3043-3046 (1975)

Evaluation of Large Aberrations Using a Lateral-Shear Interferometer Having Variable Shear

M. P. Rimmer and J. C. Wyant
Appl. Opt. 14(1) 142-150 (1975)