Abstract

Restrictions imposed by diffraction on schlieren electron density measurements are discussed. Applicability criteria are derived. It is shown that diffraction partly compensates for the advantage of longer wavelengths: while the deflection angles increase with λ2, the gain in measuring precision increases only with √λ. The criteria are not restricted to a particular spectral range. However, they were derived with special regard to extending schlieren methods to the far infrared (FIR).

© 1975 Optical Society of America

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