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Diffractographic Dimensional Measurement. Part 1: Displacement Measurement

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Abstract

This is the first of a two-part paper on measurement of displacement and profile using changes in the far-field diffraction patterns of a slit aperture formed between a test and reference object. When applied to displacement measurement the method is very accurate over a considerable range, noncontacting, linear, and easy to use. In addition to the measurement considerations involved in this diffractographic technique, three unique applications are discussed. These are: simultaneous deflection measurement along a line, deflection measurement of a surface relative to an edge, and vibration amplitude measurement using time-averaged fringes.

© 1972 Optical Society of America

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