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Conferences > WSOF > 2013 > W3 > W3.13

A Novel Scattering Model for Determination of Surface Defects in Infra-Red Optical Fibers Based on Spectral Measurements

Jonathan Abir, Eli Altus, and Dan V. Regelman

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Abstract

A novel method for determination of mechanical defects in optical fibers based on unitless parameter derived from experimental spectral transmission data, leading to cracks dimensions and density via simple optical scattering model.

© 2013 Optical Society of America

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