Ultrafast ion- and electron-spectroscopy with soft X-rays at the European XFEL

Daniel E. Rivas; Patrik Grychtol; Thomas M. Baumann; Rebecca Boll; Benjamin Erk; Alberto de Fanis; Jan Grünert; Markus Ilchen; Markus Ilchen; Jia Liu; Tommaso Mazza; Jacobo Montaño; Valerija Music; Valerija Music; Yevheniy Ovcharenko; Nils Rennhack; Arnaud Rouzée; Aljoscha Rörig; Philipp Schmidt; Sergey Usenko; René Wagner; Pawel Ziółkowski; Michael Meyer

doi:10.1364/UP.2020.M4B.35

The 22nd International Conference on Ultrafast Phenomena 2020
OSA Technical Digest (Optica Publishing Group, 2020),
paper M4B.35
•https://doi.org/10.1364/UP.2020.M4B.35

Ultrafast ion- and electron-spectroscopy with soft X-rays at the European XFEL

Daniel E. Rivas, Patrik Grychtol, Thomas M. Baumann, Rebecca Boll, Benjamin Erk, Alberto de Fanis, Jan Grünert, Markus Ilchen, Jia Liu, Tommaso Mazza, Jacobo Montaño, Valerija Music, Yevheniy Ovcharenko, Nils Rennhack, Arnaud Rouzée, Aljoscha Rörig, Philipp Schmidt, Sergey Usenko, René Wagner, Pawel Ziółkowski, and Michael Meyer

International Conference on Ultrafast Phenomena 2020

Washington, D.C. United States
16–19 November 2020
ISBN: 978-1-943580-83-5

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Poster Session II (M4B)

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D. E. Rivas, P. Grychtol, T. M. Baumann, R. Boll, B. Erk, A. de Fanis, J. Grünert, M. Ilchen, J. Liu, T. Mazza, J. Montaño, V. Music, Y. Ovcharenko, N. Rennhack, A. Rouzée, A. Rörig, P. Schmidt, S. Usenko, R. Wagner, P. Ziółkowski, and M. Meyer, "Ultrafast ion- and electron-spectroscopy with soft X-rays at the European XFEL," in The 22nd International Conference on Ultrafast Phenomena 2020, F. Kärtner, M. Khalil, R. Li, F. Légaré, and T. Tahara, eds., OSA Technical Digest (Optica Publishing Group, 2020), paper M4B.35.

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Abstract

We present the first pump/probe measurements performed at the SQS instrument of the European XFEL. We obtain the first characterization of the femtosecond temporal resolution and show the feasibility for the investigation of ultrafast dynamics.

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