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Conferences > UP > 2014 > 08.Tue.P2 > 08.Tue.P2.42

Terahertz Induced Electromigration

Andrew C. Strikwerda, Maksim Zalkovskij, Krzysztof Iwaszczuk, and Peter Uhd Jepsen

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Abstract

We report the first observation of THz-field-induced electromigration in sub-wavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.

© 2014 Optical Society of America

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