Ultrafast X-ray diffraction

D. von der Linde; K. Sokolowski-Tinten

14th International Conference on Ultrafast Phenomena
Technical Digest (CD) (Optica Publishing Group, 2004),
paper MD3

Ultrafast X-ray diffraction

D. von der Linde and K. Sokolowski-Tinten

International Conference on Ultrafast Phenomena 2004

Niigata Japan
25–30 July 2004
ISBN: 3-54024-110-8

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Diffraction and Short-Wavelength Imaging (MD)

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D. von der Linde and K. Sokolowski-Tinten, "Ultrafast X-ray diffraction," in 14th International Conference on Ultrafast Phenomena, Technical Digest (CD) (Optica Publishing Group, 2004), paper MD3.

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Abstract

Previously the capability to perform measurements with femtosecond time-resolution belonged exclusively to the domain of optics. However, in the last few years the generation of femtosecond pulses in the X-ray regime has become possible. These ultrashort X-ray pulses have enabled femtosecond time-resolution to be extended to X-rays.

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