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  • The Thirteenth International Conference on Ultrafast Phenomena
  • 2002 OSA Technical Digest Series (Optica Publishing Group, 2002),
  • paper ThD5
  • https://doi.org/10.1364/UP.2002.ThD5

T-ray diffraction tomography

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Abstract

T-ray computed tomography (T-ray CT) is an important new tomographic imaging modality utilizing ultrafast laser sources to probe the optical properties of 3 dimensional (3D) structures in the far-infrared [1]. It promises to have important applications in non-destructive mail and packaging inspection, semiconductor testing and manufacturing quality control. It provides sectional images of objects in an analogous manner to conventional computed tomography techniques such as X-ray CT.

© 2002 Optical Society of America

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