Reduction of excess laser noise in electro-optic sampling of high-speed circuits for eye-diagram measurements

O. Mitrofanov

doi:10.1364/UEO.2003.ThA5

Ultrafast Electronics and Optoelectronics
Technical Digest (Optica Publishing Group, 2003),
paper ThA5
•https://doi.org/10.1364/UEO.2003.ThA5

Reduction of excess laser noise in electro-optic sampling of high-speed circuits for eye-diagram measurements

O. Mitrofanov

Ultrafast Electronics and Optoelectronics 2003

Washington, D.C. United States
15–16 January 2003
ISBN: 1-55752-728-8

From the session
Ultrafast Lasers (ThA)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
O. Mitrofanov, "Reduction of excess laser noise in electro-optic sampling of high-speed circuits for eye-diagram measurements," in Ultrafast Electronics and Optoelectronics, Technical Digest (Optica Publishing Group, 2003), paper ThA5.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

A new optical detection scheme for measurements of small optical phase shifts is proposed and demonstrated. The scheme allows broadband reduction of excess laser noise. ~20 dB noise reduction is achieved in electro-optic sampling system for testing high-speed integrated circuits.

PDF Article

More Like This

Sensitive 320 Gb/s Eye-Diagram Measurements via Optical Sampling with a Semiconductor Optical Amplifier – Ultrafast Nonlinear Interferometer

I. Kang and K. Dreyer
WP4 Optical Fiber Communication Conference (OFC) 2003

Electro-Optic Sampling of High-Speed, InP-Based Integrated Circuits

J. M. Wiesenfeld, R. S. Tucker, A. Antreasyan, C. A. Burrus, and A. J. Taylor
WA4 Picosecond Electronics and Optoelectronics (UEO) 1987

Above 100 GHz Performance of Waveguide Integrated Photodiodes Measured by Electro-optical Sampling

D. Trommer, G. Unterbörsch, D. Schumann, O. Reimann, D. Huhse, and D. Bimberg
WF7 Optical Fiber Communication Conference (OFC) 2003

Previous Article Next Article