T-Ray Tomography

D. M. Mittleman; S. Hunsche; L. Boivin; M. C. Nuss

doi:10.1364/UEO.1997.UF5

Ultrafast Electronics and Optoelectronics
OSA Trends in Optics and Photonics Series (Optica Publishing Group, 1997),
paper UF5
•https://doi.org/10.1364/UEO.1997.UF5

T-Ray Tomography

D. M. Mittleman, S. Hunsche, L. Boivin, and M. C. Nuss

Ultrafast Electronics and Optoelectronics 1997

Incline Village, Nevada United States
ISBN: 1-55752-486-6

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Terahertz Optoelectronics (UF)

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D. M. Mittleman, S. Hunsche, L. Boivin, and M. C. Nuss, "T-Ray Tomography," in Ultrafast Electronics and Optoelectronics, M. Nuss and J. Bowers, eds., Vol. 13 of OSA Trends in Optics and Photonics Series (Optica Publishing Group, 1997), paper UF5.

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Abstract

We have extended T-ray imaging to 3-dimensional tomographic imaging, by using timing information in a reflection geometry to extract information about the object along the propagation direction.

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