Abstract
Electric field distributions in monolithic microwave integrated circuits (MMICs) have been measured using electro-optic field mapping technique. The measurements, performed in the frequency domain as well as in the time domain, are in particular used to investigate circuit-internal microwave propagation effects. The examples presented in this paper show the generation of higher harmonics, the excitation of parasitic propagation modes and the formation of shock waves in nonlinear transmission lines (NLTL), demonstrating the feasibility of the measurement technique to characterize the nonlinear electric behavior of these devices.
© 1997 Optical Society of America
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