Abstract
It is shown that the ICs in 10 Gb/s TDM systems can be fabricated with Si-bipolar production technologies while for 20 Gb/s systems present laboratory technologies are required. From the design of ICs for 40 Gb/s systems it is expected that this data rate can really be achieved using further improved Si-based technologies. However, the other circuit specifications must be relaxed compared to ICs in 10 and 20 Gb/s systems, which is possible by use of optical-fiber amplifiers and improved opto-electronic components. Moreover, speed critical circuits should be eliminated as far as possible.
© 1997 Optical Society of America
PDF ArticleMore Like This
K. Runge, R. Yu, S.M. Beccue, P.B. Thomas, P.J. Zampardi, R.L. Pierson, and K. C. Wang
UD3 Ultrafast Electronics and Optoelectronics (UEO) 1997
Tetsuyuki Suzaki
UTUB2 Ultrafast Electronics and Optoelectronics (UEO) 1995
Mark Rodwell
UD1 Ultrafast Electronics and Optoelectronics (UEO) 1997