Abstract

Direct measurement of carrier dynamics, using femtosecond light sources, has yielded a wealth of understanding within the field of condensed matter physics^[1]. Also, recently, near-field optical probe techniques have enabled optical measurements with spatial resolution below the diffraction limit^[2]. An understanding of many scientifically and technologically important issues require a knowledge of the local behavior of carriers within materials and microstructures. We report the development of the required instrumentation, and the first measurement of carrier dynamics with spatial resolution below the diffraction limit and temporal resolution below 60 fs.

© 1995 Optical Society of America