Electro-Optic Sampling of High Speed Nonlinear Devices

Kok Wai Chang; Wayne V. Sorin

doi:10.1364/UEO.1993.I3

Ultrafast Electronics and Optoelectronics
OSA Proceedings Series (Optica Publishing Group, 1993),
paper I3
•https://doi.org/10.1364/UEO.1993.I3

Electro-Optic Sampling of High Speed Nonlinear Devices

Kok Wai Chang and Wayne V. Sorin

Ultrafast Electronics and Optoelectronics 1993

San Francisco, California United States
ISBN: 1-55752-275-8

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Ultrafast Probes of Materials/Devices/Circuits (I)

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K. W. Chang and W. V. Sorin, "Electro-Optic Sampling of High Speed Nonlinear Devices," in Ultrafast Electronics and Optoelectronics, J. Shah and U. Mishra, eds., Vol. 14 of OSA Proceedings Series (Optica Publishing Group, 1993), paper I3.

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Abstract

An electrooptic measurement system which combines the advantages of equivalent-time sampling with differential detection is used for the characterization of high speed nonlinear electronic devices.

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