Subpicosecond GaAs Wafer Probe System

M. S. Shakouri; A. Black; B. A. Auld; D. M. Bloom

doi:10.1364/UEO.1993.I1

Ultrafast Electronics and Optoelectronics
OSA Proceedings Series (Optica Publishing Group, 1993),
paper I1
•https://doi.org/10.1364/UEO.1993.I1

Subpicosecond GaAs Wafer Probe System

M. S. Shakouri, A. Black, B. A. Auld, and D. M. Bloom

Ultrafast Electronics and Optoelectronics 1993

San Francisco, California United States
ISBN: 1-55752-275-8

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Ultrafast Probes of Materials/Devices/Circuits (I)

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M. S. Shakouri, A. Black, B. A. Auld, and D. M. Bloom, "Subpicosecond GaAs Wafer Probe System," in Ultrafast Electronics and Optoelectronics, J. Shah and U. Mishra, eds., Vol. 14 of OSA Proceedings Series (Optica Publishing Group, 1993), paper I1.

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Abstract

We report a subpicosecond GaAs wafer probe system which incorporates a mechanical flexure and a micromachined GaAs IC for time domain on-wafer measurements. The micromachined GaAs IC incorporates a novel high speed pulse sharpener and a two diode sampling bridge with a micromachined GaAs tip.

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