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Ultra-Deep Submicron Si MOSFETs with fT Exceeding 100 GHz

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Abstract

We have implemented Si MOSFETs with polysilicon gate lengths of ~0.1 µm. These devices measured a record 116 and 51 GHz intrinsic fT, unity- current-gain cutoff frequency at room temperature, for N and PMOS, respectively. They also show good turn-off characteristics, meeting very large scale integration (VLSI) requirement.

© 1993 Optical Society of America

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