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Development of Custom Angular Scan and Index-Mapping Optical Coherence Tomography Systems for Nondestructive Metrology of Layered Gradient Index Optical Components

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Abstract

The establishment of both angular scan and index-mapping OCT systems is presented to demonstrate the capability of OCT for characterizing large curvature optical components and for index measurement to the accuracy of 10−3 respectively.

© 2013 Optical Society of America

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