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Conferences > Sensors > 2015 > SeW1B > SeW1B.5

Plasmonic based focused light characterizing fiber

Hyuntai Kim, Luis Alonso Vazquez-Zuniga, Jinseob Kim, and Yoonchan Jeong

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Abstract

We propose a device to characterize focused light. The device includes a single nano-slit etched on a metal coated fiber tip. The device is capable of resolving the focal point, beam size, polarization, and chromatic aberration of the focused light.

© 2015 Optical Society of America

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