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Scanning Photocurrent Microscopy for Investigation of Photovoltaic Properties of Nanomaterial Film

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Abstract

We established the scanning photocurrent microscopy (SPCM) based on confocal and near-field optics, which can use various light sources with different wavelength. The photovoltaic effects of nanostructured film devices were analyzed directly and visually.

© 2013 Optical Society of America

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