Protected State Enhanced Quantum Metrology in Dense Ensembles of Two-Level Systems

Laurin Ostermann; Helmut Ritsch; Claudiu Genes

doi:10.1364/QIM.2014.QTh3A.5

Research in Optical Sciences
OSA Technical Digest (online) (Optica Publishing Group, 2014),
paper QTh3A.5
•https://doi.org/10.1364/QIM.2014.QTh3A.5

Protected State Enhanced Quantum Metrology in Dense Ensembles of Two-Level Systems

Laurin Ostermann, Helmut Ritsch, and Claudiu Genes

Quantum Information and Measurement 2014

Messe Berlin, Berlin Germany
18–20 March 2014
ISBN: 978-1-55752-995-4

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Quantum Simulation & Quantum Metrology (QTh3A)

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L. Ostermann, H. Ritsch, and C. Genes, "Protected State Enhanced Quantum Metrology in Dense Ensembles of Two-Level Systems," in Research in Optical Sciences , OSA Technical Digest (online) (Optica Publishing Group, 2014), paper QTh3A.5.

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Abstract

We present an improved Ramsey interferometric scheme for frequency detection that is tailored to address and even improve the method’s sensitivity in the presence of collective effects such as dipole-dipole couplings and correlated decay.

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