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Observation of Thermal Occupation of Room-Temperature J-Aggregate Microcavity Exciton-Polaritons

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Abstract

We present a measurement of the lower-branch exciton-polariton occupation in room-temperature J-aggregate microcavity devices under low-density steady-state excitation. The observed occupation follows a Maxwell-Boltzmann distribution at T=300K, indicating efficient polariton relaxation, necessary for achieving lasing.

© 2010 Optical Society of America

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