Abstract
We demonstrate a new concept of spectrally-resolved wavefront characterization, particular useful for high-harmonic and soft X-ray radiation. It is based on an analysis of radiation diffracted from a slit scanned in front of flat-field spectrometer.
© 2010 Optical Society of America
PDF ArticleMore Like This
E. Frumker, G. G. Paulus, D. M. Villeneuve, and P. B. Corkum
QMC7 Quantum Electronics and Laser Science Conference (CLEO:FS) 2011
Xiaomeng Liu, Matthijs Jansen, Anne de Beurs, Kjeld Eikema, and Stefan Witte
cf_11_4 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2019
P. Homer, B. Rus, J. Hřebíček, M. Kozlová, and D. Snopek
ITuF4P International Optical Design Conference (IODC) 2010