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  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • OSA Technical Digest (CD) (Optica Publishing Group, 2007),
  • paper JWA115

Detection of Gold in the Facet of a Failed Semiconductor Laser Diode

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Abstract

The damaged region of a failed semiconductor laser diode was analyzed using FIB nanotomography and 3D TOF-SIMS. Gold, a deep level trap, was found between the antireflective coating and the semiconductor facet.

© 2007 Optical Society of America

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