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  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2006),
  • paper JTuD67

Novel technique to remove measurement noise generated by pinhole diffraction phenomenon

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Abstract

We have developed a novel technique to remove measurement noise generated by pinhole diffraction in confocal microscopy. We compared the refractive index measurement results using our technique with those obtained using a traditional system.

© 2006 Optical Society of America

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