Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > QELS > 2003 > QTuI > QTuI5
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference
  • Technical Digest (Optica Publishing Group, 2003),
  • paper QTuI5

Quantum process tomography with entangled photons.

M. W. Mitchell, C. W. Ellenor, J. S. Lundeen, K. J. Resch, and A. M. Steinberg

Not Accessible

Your library or personal account may give you access

Abstract

Using entangled photons from parametric down-conversion as optical qubits, we characterize single- and multiple-qubit operations by quantum process tomography. This allows complete characterization of the operations, including decoherence.

© 2003 Optical Society of America

PDF Article
More Like This
Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography

J. B. Altepeter, D. Branning, E. Jeffrey, T. C. Wei, P. G. Kwiat, R. T. Thew, J. L. O’Brien, M. A. Nielsen, and A. G. White
QTuI4 Quantum Electronics and Laser Science Conference (CLEO:FS) 2003

Quantum Process Tomography by Direct Characterization of Quantum Dynamics Using Hyperentangled Photons

Trent M. Graham, Julio T. Barreiro, and Paul G. Kwiat
QWD6 International Conference on Quantum Information (QIM) 2011

Quantum Process Tomography by Direct Characterization of Quantum Dynamics Using Hyperentangled Photons

Trent Graham, Julio Barreiro, and Paul G. Kwiat
JThC2 Conference on Lasers and Electro-Optics (CLEO:S&I) 2010

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use