Abstract
In several experiments,1,2,3,4 kα radiation was used to monitor ultrafast structural changes in matter. An open question in all of these pumpprobe experiments was, however, the exact temporal duration of the probing x-rays. This ultimately determines the temporal resolution of the experiment. The determination of the temporal duration of sub-picosecond x-ray pulses is very challenging. In this letter we report on the measurement of the temporal profile of the Si-Kα line emission from a femtosecond laser produced plasma. The measurement is performed by cross- correlating the Si-Kα pulse with the ultrafast response of a laser pumped MBE-grown thin CdTe crystal layer. The pump laser induces an ultrafast change of the CdTe crystal structure and causes a rapid decrease of the x-ray reflectivity. In contrast to InSb bulk measurements,3 the x-ray penetration depth in this measurement is definitely limited by the thickness of the crystalline layer.
© 2002 Optical Society of America
PDF ArticleMore Like This
A. Morak, I. Uschmann, T. Feurer, E. Förster, and R. Sauerbrey
MB5 International Conference on Ultrafast Phenomena (UP) 2002
A. Rousse, P. Audebert, J.P. Geindre, F. Falliès, J.C. Gauthier, A. Mysyrowicz, G. Grillon, and A. Antonetti
WC.27 International Conference on Ultrafast Phenomena (UP) 1994
Ch. Ziener, I. Uschmann, G. Stobrawa, T. Feurer, H. Schwoerer, and R. Sauerbrey
TuF6 International Conference on Ultrafast Phenomena (UP) 2000