Near-field optical polarization microscopy in internal-reflection configuration with ultrasmall aperture probe

Toshiharu Saiki

Quantum Electronics and Laser Science Conference
OSA Technical Digest (Optica Publishing Group, 2001),
paper QTuE2

Near-field optical polarization microscopy in internal-reflection configuration with ultrasmall aperture probe

Toshiharu Saiki

Quantum Electronics and Laser Science Conference 2001

Baltimore, Maryland United States
6–10 May 2001
ISBN: 1-55752-663-X

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Poster Session 1 (QTuE)

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T. Saiki, "Near-field optical polarization microscopy in internal-reflection configuration with ultrasmall aperture probe," in Quantum Electronics and Laser Science Conference, G. Agrawal, Y. Yamamoto, T. Norris, and J. Thomas, eds., OSA Technical Digest (Optica Publishing Group, 2001), paper QTuE2.

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Abstract

Polarization-sensitive imaging using near-fielc scanning optical microscopy (NSOM) is a fundamental method for the magneto-optical study ol micro-structures.

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