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  • Quantum Electronics and Laser Science Conference
  • OSA Technical Digest (Optica Publishing Group, 2001),
  • paper QTuA5

Breaking the diffraction limit in far-field light microscopy by stimulated emission

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Abstract

The advantage of far-field light microscopy over electron, X-ray, or scanning probe microscopes is the non-destructive imaging of the interior of biological specimens.

© 2001 Optical Society of America

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