Nanometric probe-sample interactions via optical near fields: derivation and characteristics

Suguru Sangu; Kiyoshi Kobayashi; Motoichi Ohtsu; Motoichi Ohtsu

Quantum Electronics and Laser Science Conference
OSA Technical Digest (Optica Publishing Group, 2000),
paper QTuA23

Nanometric probe-sample interactions via optical near fields: derivation and characteristics

Suguru Sangu, Kiyoshi Kobayashi, and Motoichi Ohtsu

Quantum Electronics and Laser Science Conference 2000

San Francisco, California United States
7–11 May 2000
ISBN: 1-55752-608-7

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Poster Session (QTuA)

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S. Sangu, K. Kobayashi, and M. Ohtsu, "Nanometric probe-sample interactions via optical near fields: derivation and characteristics," in Quantum Electronics and Laser Science Conference, T. Gallagher, H. Van Driel, H. Gibbs, and D. Wineland, eds., OSA Technical Digest (Optica Publishing Group, 2000), paper QTuA23.

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Abstract

Recent experimental studies have revealed distinct characteristics of optical near fields.¹

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