Mapping the phase of light in an integrated optical waveguide device

M.L.M. Balistreri; J.P. Korterik; L. Kuipers; N.F. van Hulst

Quantum Electronics and Laser Science Conference
OSA Technical Digest (Optica Publishing Group, 2000),
paper QMF6

Mapping the phase of light in an integrated optical waveguide device

M.L.M. Balistreri, J.P. Korterik, L. Kuipers, and N.F. van Hulst

Quantum Electronics and Laser Science Conference 2000

San Francisco, California United States
7–11 May 2000
ISBN: 1-55752-608-7

From the session
Near-Field Optics (QMF)

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M. L. M. Balistreri, J. P. Korterik, L. Kuipers, and N. F. van Hulst, "Mapping the phase of light in an integrated optical waveguide device," in Quantum Electronics and Laser Science Conference, T. Gallagher, H. Van Driel, H. Gibbs, and D. Wineland, eds., OSA Technical Digest (Optica Publishing Group, 2000), paper QMF6.

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Abstract

Nowadays, a measurement of the intensity of the optical field in integrated optical waveguide devices with a photon scanning tunneling microscope (PSTM) is reasonably routine.^1–3

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