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Optica Publishing Group
  • Quantum Electronics and Laser Science Conference
  • OSA Technical Digest (Optica Publishing Group, 1999),
  • paper QWG1

Coherence of excitonic secondary emission quantified by time-resolved speckle analysis

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Abstract

Near band-edge optical properties in undoped semiconductor nanostructures at low temperatures are often dominated by excitonic processes. Present interest is focusing on the coherence properties of light emission after short-pulse excitation. Emission in a non-specular direction involves scattering processes, and the temporal emission dynamics allows to look into the corresponding microscopic mechanisms such as interface roughness, phonon emission, or exciton-exciton interaction. If static disorder dominates, the scattering is elastic (Rayleigh scattering) and preserves the coherence. The other extreme is incoherent luminescence which has lost all phase memory. A clear distinction between the two cases is not possible in experiments where the emission is collected within a wide detection angle.1 Interferometric measurements are considered to be the ultimate means for determining the coherence properties of radiation. However, in a non-specular direction, an interferometric signal appears only when reduc-ing the detection to a single mode (or single speckle).2

© 1999 Optical Society of America

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