Abstract

Recently, ultraviolet (UV) to blue-green light-emitting diode has attracted widespread interest.^1,2 ZnO has a bandgap of 3.37eV, combined with high excitonic gain and large exciton binding energy, it is therefore a suitable candidate for the UV optoelectronic device applications. For these reasons, a thorough understanding of the dephasing speed, recombination mechanisms and its third-order optical nonlinearity is necessary. In this paper, we report the third-order optical nonlinearity χ⁽³⁾ measurements in ZnO microcrystallite thin films from cryogenic to room temperatures using femtosecond degenerate four-wave-mixing (DFWM).

© 1999 Optical Society of America