Abstract
An improved understanding of localized surface mediated reactivity would benefit from dynamical studies.1 Toward this end, a new experimental technique for obtaining simultaneous spatial and temporal resolution of optically initiated dynamics at interfaces is presented. The method, based on the integration of femtosecond-optical spectroscopy and scanning probe microscopy (FOS-SPM), is capable of spatial localization of optically induced phenomenon at interfaces. FOS-SPM has been shown to be capable of identifying and differentiating between different optoelectronic mechanisms, specifically multiphoton ionization (MPI) and optical rectification.2 Recent results on the application of correlated FOS-SPM to study localized surface reactivity are presented here.
© 1997 Optical Society of America
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