Abstract
A femtosecond-resolved low-temperature near-field scanning optical microscope (NSOM) is used to monitor the spatiotemporal evolution of excifonic spins in magnetic semiconductor quantum structures that are laterally patterned with a focused beam of Ga+ ions.1,2 Polarization-resolved photoluminescence (PL) images reveal a spin-dependent energy landscape in which the Zeeman splitting is diminished in implanted regions, and carrier and spin behavior is directly distinguished by sharp differences in intensity and polarization profits. Time-resolved measurements suggest that exciton diffusion acquires a spin-dependent component in the presence of a magnetic field. The data demonstrate fundamental limitations on the measurement of polarized PL from semiconductors in the nearfield regime.
© 1996 Optical Society of America
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