Abstract
The growth of high-Tc. superconductors on silicon wafers is generally hampered by the existence of a critical thickness dc. at which microcracks appear within the film. The critical thickness dc. for YBa2Cu3O7 on YSZ (yttria-stabilized zirconia) on silicon is known to be about 50-70 nm. Recent experimental results suggest that the density of microcracks or weak links increases rapidly at thicknesses well below the established value of the critical thickness.1
© 1995 Optical Society of America
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