High-resolution atomic position measurement

G. R. Welch; K. D. Stokes; J. Gardner; M. Marable; C. Schnurr; J. E. Thomas

Quantum Electronics and Laser Science Conference
OSA Technical Digest (Optica Publishing Group, 1992),
paper QMA2

High-resolution atomic position measurement

G. R. Welch, K. D. Stokes, J. Gardner, M. Marable, C. Schnurr, and J. E. Thomas

Quantum Electronics and Laser Science Conference 1992

Anaheim, California United States
10–15 May 1992
ISBN: 1-55752-540-5

From the session
Atom Manipulation (QMA)

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G. R. Welch, K. D. Stokes, J. Gardner, M. Marable, C. Schnurr, and J. E. Thomas, "High-resolution atomic position measurement," in Quantum Electronics and Laser Science Conference, E. Ippen, S. Chu, J. Shah, and C. Weiman, eds., Vol. 13 of OSA Technical Digest (Optica Publishing Group, 1992), paper QMA2.

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Abstract

Recently, we have begun to explore new optical techniques for ultra high-resolution position measurement and localization of moving atoms. Ultimately, these techniques should be capable of achieving uncertainty-principle-limited spatial resolution in the nanometer region.^1–3

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