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  • Quantum Electronics and Laser Science Conference
  • OSA Technical Digest (Optica Publishing Group, 1989),
  • paper WGG1

Multiphoton ionization spectroscopy of free radicals containing semiconductor elements

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Abstract

Resonance enhanced multiphoton ionization (REMPI) spectroscopy has become an effective tool for discovering new electronic states of free radicals and the sensitive detection of free radicals in reactive systems.1 We report analyses of the first electronic spectra of the radicals SiH3 and GeH3. Using the results of our REMPI studies, this paper will highlight the similarities and differences between the spectra and electronic structures of the first row free radical CH3 and the isovalent second and third row free radicals SiH3 and GeH3.

© 1989 Optical Society of America

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