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Anderson Localization in 2-D SOI waveguide arrays using orthogonal Ritz Galerkin Variational method

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Abstract

We have studied Anderson localization in 2-D Silicon waveguide arrays having random deviation of the refractive index of the cores using the Ritz Galerkin Variational method wherein the trial field is generated using Gram Schmidt Orthogonalization procedure.

© 2014 Optical Society of America

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