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Optical, Structural and Morphological Characterization of ZnS Thin Films grown by RF Sputtering

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Abstract

Effect of thickness on transmittance, structure, photoluminescence and surface morphology of sputtered ZnS thin films are studied. Band-gap increases with decreasing thickness. GIXRD shows cubic phase. Crystallinity increases with thickness. Photoluminescence shows peak at 475nm.

© 2012 Optical Society of America

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