Abstract

The present work reports structural and ellipsometric characterization of Ag/Bi stacks. It demonstrates a possibility for tuning of the epsilon-near-zero region and reduction of the optical losses in a wide spectral range from 0.75 to 3.5 eV.

© 2020 The Author(s)

PDF Article
More Like This
Physics and Applications of Epsilon-Near-Zero Materials

Robert W. Boyd
NpTh2D.1 Nonlinear Photonics (NP) 2020

Broadband terahertz generation from an epsilon-near-zero thin film

Wenhe Jia, Meng Liu, Yongchang Lu, Xi Feng, Qingwei Wang, Xueqian Zhang, Yibo Ni, Futai Hu, Mali Gong, Xinlong Xu, Yuanyuan Huang, Weili Zhang, Yuanmu Yang, and Jiaguang Han
FM1B.6 Frontiers in Optics (FiO) 2020

Epsilon-Near-Zero ITO Metafilm and Near-IR Photonic Application

Jimmy H. Ni, Andrew S. DeLoach, Sang-Yeon Cho, and Weimin Zhou
FTh5C.4 Frontiers in Optics (FiO) 2020

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription