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  • OSA Advanced Photonics Congress (AP) 2020 (IPR, NP, NOMA, Networks, PVLED, PSC, SPPCom, SOF)
  • OSA Technical Digest (Optica Publishing Group, 2020),
  • paper JTu4C.5
  • https://doi.org/10.1364/NOMA.2020.JTu4C.5

Ellipsometric Characterization of Ag-Bi Films for Application as Epsilon-Near-Zero Materials

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Abstract

The present work reports structural and ellipsometric characterization of Ag/Bi stacks. It demonstrates a possibility for tuning of the epsilon-near-zero region and reduction of the optical losses in a wide spectral range from 0.75 to 3.5 eV.

© 2020 The Author(s)

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