Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > PEMD > 2003 > MCI > 195

Investigation of Ferroelectric Domains in LiNbO3 with Atomic Force Microscopy

Nils Benter, Ákos Hoffmann, Elisabeth Soergel, and Karsten Buse

Not Accessible

Your library or personal account may give you access

Abstract

Electrostatic force detection with an atomic force microscope (AFM) is ideally suited for the study of the surface properties of dielectric materials. With this technique the domain patterns of periodically poled LiNbO3-crystals (PPLN) and of LiNbO3 crystals that were modified, e.g., by high electric fields, could be detected, without etching the surface.

© 2003 Optical Society of America

PDF Article
More Like This
Investigation of Photorefractive Strontium-Barium-Niobate Crystals with Atomic Force Microscopy

Elisabeth Soergel, Ákos Hoffmann, Nils Benter, and Karsten Buse
29 Photorefractive Effects, Materials, and Devices (PR) 2003

Detection of ferroelectric domains with a scanning force microscope

Tobias Jungk, Elisabeth Soergel, Ákos Hoffmann, and Karsten Buse
127 Photorefractive Effects, Materials, and Devices (PR) 2005

UV laser-induced ferroelectric domain structures investigated by piezoresponse force microscopy

T. Jungk, A. Hoffmann, E. Soergel, S. Mailis, A. C. Muir, I. T. Wellington, C. E. Valdivia, C. L. Sones, and R. W. Eason
CE7_4 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2007

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use