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Conferences > OTST > 2005 > TuC > TuC2

THz microscopy of charge carrier distributions

F.F. Buersgens, R. Kersting, and H.-T. Chen

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Abstract

We report on the application of apertureless THz microscopy for sensing charge carrier distributions in semiconductors on submicron scales. A spatial resolution of less than 1 µm allows for the detection of about 1000 electrons.

© 2005 Optical Society of America

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