Add to BibSonomyAbstract
We demonstrate a method based on carrier frequency interferometry that measures surface deformation with high accuracy. The method is applied to assess deformation in thin films and multilayer dielectric coatings deposited on thick substrates.
© 2016 Optical Society of America
PDF ArticleMore Like This
Carrier frequency interferometry for wavefront measurements of coated optics
E. Jankowska, S. Drobczynski, and C.S. Menoni
JTu5A.116 CLEO: Applications and Technology (CLEO:A&T) 2017
Low Residual Stress in Si3N4/SiO2 Multilayer Coatings by Reactive Pulsed Magnetron Sputtering Technique
Chuen-Lin Tien, Po-Chih Chen, Kuei-Luen Chen, Chien-Jen Tang, Sheng-Hua Lu, and Shih-Chin Lin
ThD.12 Optical Interference Coatings (OIC) 2016
Carrier-envelope offset frequency stabilization in a femtosecond optical parametric oscillator without nonlinear interferometry
Karolis Balskus, Melissa Fleming, Richard A. McCracken, Zhaowei Zhang, and Derryck T. Reid
SM1H.5 CLEO: Science and Innovations (CLEO:S&I) 2016