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Conferences > OIC > 2016 > ThA > ThA.3

A study of the E-field intensity enhancement of nodular defects in a broadband high reflection coating

Hongping Ma, Xinbin Cheng, Jinlong Zhang, Bin Ma, Zhanshan Wang, and Yongjian Tang

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Abstract

Five sizes of nodules were prepared in a broadband high reflection (HR) coating. The electric-field (E-filed) intensity enhancement was suppressed for most nodules except one kind. Our previous model was improved to give an explanation.

© 2016 Optical Society of America

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